B1201U
| Model | B1201U |
| Description | solid state crowbar devices |
| PDF file | Total 212 pages (File size: 2M) |
| Chip Manufacturer | TECCOR |
UL 60950 3rd Edition (formerly UL 1950, 3rd edition)
Passes 1, 2, 3, 4, and 5 shown in Figure 4.5 refer respectively to Tests L1 and M1, L2 and
M2, L3 and M3, L4 and M4, and L5 shown in Table 4.17.
Equipment may be subject to the overvoltage tests shown in Table 4.17. The tests are
designed to simulate the following:
• Contact with primary power
• Short-term induction as a result of a primary power fault to a multi-earth neutral
• Long duration power fault to Ground
• Direct contact between the power mains and a telecommunications cable
Table 4.17
Test
L1
L2
L3
L4
L5
M1
M2
M3
M4
UL 60950 Overvoltage Test
Voltage
(V
RMS
)
600 V
600 V
600 V
200 V
120 V
600 V
600 V
600 V
600 V
Current
(A)
40
7
2.2
2.2
25
40
7
2.2
2.2
Time
1.5 s
5s
30 min
30 min
30 min
1.5 s
5s
30 min
30 min
Reduce to 135% fuse rating
Reduce to 135% fuse rating
Reduce to 135% fuse rating
Reduce to 135% fuse rating
Comments
Current
Limiting
Resistor
Secondary Protector
Simulator or
Wiring Station
Timed
Switch
Variable
Voltage
Source
Telecommunication Equipment
Network Connection
Under Test
Points
Equipment
Earth
Figure 4.6
Metallic Connection Appearances
© 2002 Teccor Electronics
SIDACtor
®
Data Book and Design Guide
4 - 21
http://www.teccor.com
+1 972-580-7777
Regulatory
Requirements
Notes:
• ISDN S/T interface only L1, L2, L5, M1, and M2.
• Reduce to 135% rated value of fuse if Test 3 resulted in open condition.
• L4 and M4 are conducted only if
SIDACtor
V
S
³
285 V
S
and then run at voltage level just below V
S
.
• For test conditions M1, L1, M5, and L5 a wiring simulator (MDL 2 A fuse) is used.
• Compliance means no ignition or charring of the cheesecloth, and/or the wiring simulator does not open.
• If the secondary protector simulator is used (MDQ 1.6), it is allowed to open.
• Tests 2, 3, and 4 are required only if the unit is not a fire enclosure.
• Figure 4.6 and Figure 4.7 show the M (metallic) and L (longitudinal) test connections.
