IC275-15218
| Model | IC275-15218 |
| Description | IC Socket, BGA152, 152 Contact(s) |
| PDF file | Total 2 pages (File size: 144K) |
| Chip Manufacturer | YAMAICHI |
Test Contactors
IC275 Series
IC275- 165 05
Socket Series
No. of Leads
Design No.
Insulation Resistance:
Withstanding Voltage:
Contact Resistance:
Operating Temperature:
Characteristics
1,000M�½minimum at 700 VDC
700 VAC for 1 Minute
2m�½ or less at 10mA/20mV (Initial)
-40ûC ~ +125ûC
Material
PEI (Glass Filled)
Micro Spring Probes
Gold over Nickel
NOTE:
Pogo Pin or Thru-Hole
available.
Insulator:
Contact:
Plating:
DESCRIPTION
Test contactor sockets from Yamaichi are ideal for automated or manual testing of BGA, LGA and other packages such as
CSP with micro miniature balls down to .3mm in diameter, QFP and other gullwing leaded ICÕs.
These test contactors combine a low profile, small body with long life and excellent electrical characteristics as expected
in todayÕs increasingly advanced and specialized test environments.
Each test contactor is designed and manufactured with or without a lid for your specific device testing application, taking
any special requirement into consideration.
Single or double ended micro Contact Spring Probes are used in Series 274 and 275. These contacts provide an ideal
connection between the device and the test board. Pitch configurations are available from .50mm to 1.50mm.
ORDERING PROCEDURE
Note: Each Test Contactor Socket is custom built.
Part numbers listed are socket configurations previously designed and manufactured by Yamaichi for a specific device.
Caution:
Even if a device configuration matches the pin count and pitch shown in the listing it is strongly recommended to
contact the factory prior to selecting and ordering any socket.
The customer must specify only the Socket Series Number of choice in addition to providing all device parameters and
special requirements. The final part number will be determined by Yamaichi.
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