J305-TA13-E3
| Model | J305-TA13-E3 |
| Description | Transistor |
| PDF file | Total 7 pages (File size: 96K) |
| Chip Manufacturer | VISHAY |
J304/305
Vishay Siliconix
SPECIFICATIONS (T
A
= 25_C UNLESS OTHERWISE NOTED)
Limits
J304
J305
Parameter
Static
Gate-Source Breakdown Voltage
Gate-Source Cutoff Voltage
Saturation Drain Current
b
Gate Reverse Current
Gate Operating Current
b
Drain Cutoff Current
Drain-Source On-Resistance
Gate-Source Forward Voltage
Symbol
V
(BR)GSS
V
GS(off)
I
DSS
I
GSS
I
G
I
D(off)
r
DS(on)
V
GS(F)
Test Conditions
I
G
=
−1
mA
, V
DS
= 0 V
V
DS
= 15 V, I
D
= 1 nA
V
DS
= 15 V, V
GS
= 0 V
V
GS
=
−20
V, V
DS
= 0 V
T
A
= 100_C
V
DG
= 10 V, I
D
= 1 mA
V
DS
= 10 V, V
GS
=
−6
V
V
GS
= 0 V, I
D
= 300
mA
I
G
= 1 mA , V
DS
= 0 V
Typ
a
−35
Min
−30
−2
5
Max
Min
−30
Max
Unit
V
−6
15
−100
−0.5
1
−3
8
−100
V
mA
pA
nA
pA
W
V
−2
−0.2
−20
2
200
0.7
Dynamic
Common-Source
Forward Transconductance
Common-Source
Output Conductance
Common-Source Input Capacitance
Common-Source
Reverse Transfer Capacitance
Common-Source
Output Capacitance
Equivalent Input Noise Voltage
g
fs
g
os
C
iss
C
rss
C
oss
e
n
V
DS
= 10 V, V
GS
= 0 V
f = 100 Hz
V
DS
= 15 V, V
GS
= 0 V
f = 1 MHz
V
DS
= 15 V V
GS
= 0 V f = 1 kHz
V,
V,
50
2.2
0.7
1
10
nV⁄
√Hz
p
pF
50
4.5
7.5
3
mS
mS
TYPICAL HIGH-FREQUENCY SPECIFICATIONS (T
A
= 25_C UNLESS OTHERWISE NOTED)
Limits (Typ)
J304
J305
Parameter
High-Frequency
Common-Source Input Conductance
Common-Source Input Susceptance
Common-Source Output Conductance
Common-Source Output Susceptance
Common-Source Forward Transconductance
Common-Source Power Gain
Noise Figure
Symbol
g
iss
b
iss
g
oss
b
oss
g
fs
G
ps
NF
Test Conditions
V
DS
= 15 V, V
GS
= 0 V
100
MHz
400
MHz
100
MHz
400
MHz
Unit
mS
mS
mS
mS
dB
80
2
60
0.8
4.4
20
1.7
800
7.5
80
3.6
4.2
11
3.8
80
2
60
0.8
3
V
DS
= 15 V V
GS
= 0 V
V,
V
DS
= 15 V, I
D
= 5 mA
R
G
= 1 kW
Notes
a. Typical values are for DESIGN AID ONLY, not guaranteed nor subject to production testing.
b. Pulse test: PW
v300
ms,
duty cycle
v2%.
NH
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
www.vishay.com
2
Document Number: 70236
S-50077—Rev. E, 24-Jan-05
