X1G004241004813
| Model | X1G004241004813 |
| Description | LVDS Output Clock Oscillator, |
| PDF file | Total 7 pages (File size: 438K) |
| Chip Manufacturer | SEIKO |
3.Test circuit
1) To observe waveform and current (case 1)
A
+3.3 V
By-pass
capacitor 2
Power
supply 1
Vcc
OUT
OUT
Differentila probe
100 Ω
OE
OE pin*
NC
GND
Oscillo-
scope
By-pass
capacitor 1
* The lines from OUT and OUT pin are same length.
* To measure the disable current, OE pin is connected to GND
2) To observe waveform and current (case 2)
A
+3.3 V
By-pass
capacitor 2
Power
supply 1
Vcc
OUT
OUT
50 Ω
OE
OE pin
NC
GND
50 Ω
By-pass
capacitor 1
V
OD
V
V
V
OS
* The lines from OUT and OUT pin are same length.
3) Measurement condition
A) Oscilloscope
•Bandwidth should be 5 times higher than DUT’s output frequency (4 GHz).
•Probe ground should be placed closely from test point and lead length should be as short as possible.
B) By-pass capacitor 1 (approx. 0.01 μF to 0.1 μF) places closely between Vcc and GND.
C) By-pass capacitor 2 (approx. 10 μF) places closely between power supply terminals on the board.
D) Use the current meter whose internal impedance value is small.
E) Power supply
• Start up time (0 Vg90 %Vcc) of power source should be more than 150 μs and
slew rate should be less than 19.8 mV/μs.
• Impedance of power supply should be as low as possible.
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